JESD 659 for Reliability Monitoring Updated

JESD 659, Failure-Mechanism-Driven Reliability Monitoring, has just been revised. The new Revision C is available from Document Center Inc. in both paper format and for pdf download.  You can even get a copy as part of our Standards Online cloud access subscription service.  This standard is used to monitor component and subassembly reliability in the electronics industry.

A part of a statistical process control (SPC) system, many reliability metrics are focused on a stress-driven approach.  The JESD 659 differs from this, with metrics for monitoring failure mechanisms.  What might these be?  They can be intrinsic (wearout and systematic) and extrinsic (defect-base) sources of failure.

How does it work?  The supplier must assess all failure mechanisms that significantly contribute to the failure rate in the field.  Then a monitoring test for each needs to be set up.  So the JESD 659 reviews process controls, identification of failure mechanisms, when to establish a monitor, what is included, your control action system, and how to optimize your monitor(s).

Of course, those of you using the JESD 659 Revision B will want to know what changes have been made in the new Revision C. Luckily for you, the authoring committee has provided you with an informative Annex A with your answers!  This Annex reviews the differences in the two editions.  But do note, the new Revision C is a significant revision and simplification of  the previous document.

Now you need your copy.  Consider purchasing it from Document Center Inc., an authorized distributor of the JEDEC standards.  Why?  You’ll get a variety of delivery choices, plus our best-in-class notification service for future changes is included at no additional charge.

For those of you in the electronics industry, you’ll also be pleased to learn that Document Center Inc. has a wide variety of standards geared towards your industry.  We are also authorized distributors for IPC and have a complete collection of MIL and SMD drawings in our catalog as well.  Search for and order the publications you need at our webstore, www.document-center.com.  Here is a direct link to the order page for JESD 659 for your convenience.

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