JESD-22-A110 Revision D, Highly Accelerated Temperature and Humidity Stress Test (HAST), has just been released in November. It is one in a series of specialized tests for solid state devices maintained by the JEDEC Solid State Technology Association.
The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.
The change made to the new JESD22-A110 D, compared to its predecessor, JESD22-A110 C (January 2009) is the addition of Note 1 and Note 2 in Clause 4.5.
The change to the JESD22-A110 C compared to the JESD22-A110 B, was the addition of a note in Clause 4.4.
Copies of this standard may be purchased from Document Center Inc. at it’s website (www.document-center.com) or by phone (650-591-7600), fax (650-591-7617) or email (email@example.com). Document Center Inc. carries all the JEDEC standards under license agreement with the association.