JEDEC has just released the new JESD 47 Revision I, “Stress-Test-Driven Qualification of Integrated Circuits,” and it’s available now from Document Center Inc. in either paper or pdf format. This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed. Qualification is aimed at components used in commercial or industrial operating environments.
JESD 47I replaces the JESD 47H, which is now obsolete. Changes include modifications to Clauses 1 and 5.5, as well as added details in Figure 1.
These tests are capable of stimulating and precipitating semiconductor device and packaging failures. The objective is to precipitate failures in an accelerated manner compared to use conditions.
Failure Rate projections usually require larger sample sizes than are called out in qualification testing. For guidance on projecting failure rates, refer to JESD85 Methods for Calculating Failure Rates in Units of FITs.
This qualification standard is aimed at a generic qualification for a range of use conditions, but is not applicable at extreme use conditions such as military applications, automotive under-the-hood applications, or uncontrolled avionics environments, nor does it address 2nd level reliability considerations, which are addressed in JEP150.
Where specific use conditions are established, qualification testing tailored to meet those specific requirements can be developed, using JESD94 that will result in a better optimization of resources.
All current JEDEC standards (as well as many obsolete ones) can be purchased from Document Center Inc. using our website, www.document-center.com. Or contact us by phone (650-591-7600), fax (650-591-7617) or email (email@example.com). Based in Silicon Valley, Document Center provides you with complete sales, monitoring, auditing and reporting services for the standards you use in your business.