JESD47 New Revision H on Stress-Test-Driven Qualification of Integrated Circuits released February, 2011

JESD47, Stress-Test-Driven Qualification of Integrated Circuits, has just been released as the new Revision H dated 2/2011.  The standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

This qualification standard is not aimed at extreme use conditions such as military applications, automotive under-the-hood applications, or uncontrolled avionics environments, nor does it address 2nd level reliability considerations, which are addressed in JEP150.

Tables in the standard list qualification requirements not only for new components but also for a qualification family or category of change.  It is expected that the IC sampling lot will pass all appropriate qualification tests derived from these tables.

The new JESD47 Revision H and all JEDEC standards can be purchased from Document Center Inc. at our website, www.document-center.com.  Or call (650-591-7600), fax (650-591-7617) or email us (info@document-center.com).  We’re happy to help you with your procurement needs or with any standards questions you might have.

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Claudia Bach

Claudia Bach is the President of Document Center Inc. and a world-wide recognized expert on Standards and Standards Distribution. You can connect with her on Google+

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